Characterization of Condensed Matter
An Introduction to Composition, Microstructure, and Surface Methods
1. Auflage September 2023
368 Seiten, Hardcover
141 Abbildungen (122 Farbabbildungen)
9 Tabellen
Lehrbuch
Kurzbeschreibung
A comprehensive book that includes essential techniques with their fundamental, instrumentation and application in structural and composition characterization of condensed matter.
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Ein umfassendes Buch, in dem wesentliche Techniken zur Charakterisierung der Struktur und Zusammensetzung kondensierter Materie sowie die jeweiligen Grundlagen, benötigten Instrumente und möglichen Anwendungen dargestellt sind.
Chapter 1. Universe, Matter, Condensed Matter and Materials
Chapter 2. Laser Interferometer Gravitational Wave Observatory
Chapter 3. Fundamentals of Crystallography for Microstructure Characterization of Condensed Matter
PART II. Electromagnetic Spectroscopy
Chapter 4. Element of X-Ray Diffraction
Chapter 5. X-Ray Fluorescence Spectroscopy (XRF)
Chapter 6. X-Ray Emission Spectroscopy (XES)
Chapter 7. X-Ray Absorption Spectroscopy (XAS): X-Ray Absorption Near Edge Structure (XANES) and Extended X-Ray Absorption Fine Structure (EXAFS)
Chapter 8. X-Ray Raman Scattering (XRS(
Chapter 9. Fourier Transform Infrared Spectroscopy (FTIR)
Chapter 10. Energy Dispersive X-Ray Spectrum of Elements (EDX)
PART III. Characterization Methods Based on the Particle (Electron or Electron Beam, Neutron)-Matter Interaction
Chapter 11. Scanning Electron Microscope (SEM)
Chapter 12. Transmission Electron Microscope (TEM)
Chapter 13. Spherical Aberration Corrected Transmission Electron Microscope (SAC-TEM)
Chapter 14. Environmental Transmission Electron Microscope (ETEM)
Chapter 15. Holography
PART IV. Characterization Methods for Hyperfine Structures Related to the Magnetic Properties of Electrons and Nuclei
Chapter 16. Nuclear Magnetic Resonance Spectroscopy
Chapter 17. Mössbauer Effect and Mössbauer Spectroscopy
PART V. Surface Analysis Method
Chapter 18. Atomic Force Microscope (AFM)
Chapter 19. X-Ray Photoelectron Spectroscopy (XPS)
PART VI. Some Progress and Perspective
Chapter 20. Instrumentation Based on Fundamental Progress in Interaction Electromagnetic Wave and Matter, and Electron-Matter Interaction
Qingwei Liao received her PhD degree from Tianjin University, China, in Microelectronics, in 2012, visited Harvard University for one year from 2018 to 2019, and is currently an Associate Professor of Beijing Information Science and Technology University. She has published more than 60 SCI-indexed journal papers. Her research area include: applied physics, nano materials, sensing technology and energy conversion, absorbing materials, ferro/piezo materials. She serves as the main lecturer of courses like Modern analytical testing methods for graduate students.