Handbook of Nanoscopy
1. Edition April 2012
XXXII, 1418 Pages, Hardcover
838 Pictures (99 Colored Figures)
15 tables
Handbook/Reference Book
Short Description
In-depth coverage of all imaging technologies from the optical to the electron and scanning techniques. Adopting a twofold approach, this ready reference and handbook in one firstly presents the various technologies as such, before going on to cover the materials class by class.
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Further versions
This completely revised successor to the Handbook of Microscopy supplies in-depth coverage of all imaging technologies from the optical
to the electron and scanning techniques. Adopting a twofold approach, the book firstly presents the various technologies as such, before going
on to cover the materials class by class, analyzing how the different imaging methods can be successfully applied. It covers the latest developments in techniques, such as in-situ TEM, 3D imaging in TEM and SEM, as well as a broad range of material types, including metals,
alloys, ceramics, polymers, semiconductors, minerals, quasicrystals, amorphous solids, among others. The volumes are divided between
methods and applications, making this both a reliable reference and handbook for chemists, physicists, biologists, materials scientists and
engineers, as well as graduate students and their lecturers.
From the Past to the Future
VOLUME I: Methods
LIGHT MICROSCOPY
Fundamentals of Light Microscopy
Optical Contrasting of Microstructures
Near-Field Optical Microscopy
X-RAY MICROSCOPY
Soft X-Ray Imaging
X-Ray Microtomography and X-Ray Topography
MAGNETIC MICROSCOPY
NMR Imaging
FIELD ION MICROSCOPY
Field Emission and Field Ion Microscopy
SCANNING POINT PROBE TECHNIQUES
Scanning Probe Microscopy
Atomic Force Microscopy
ELECTRON MICROSCOPY: STATIONARY BEAM METHODS
Transmission Electron Microscopy (TEM)
High-Resolution TEM
Aberration-Corrected High Resolution Microscopy
Electron Energy Loss Spectroscopy Imaging
Low Energy Electron Microscopy
Lorentz Microscopy
Electron Holography Methods
Electron Tomography
In-Situ TEM
Nanolab
Dynamic TEM
SCANNING BEAM METHODS
Scanning Electron Microscopy and Scanning Ion Microscopy
Focused Ion Beam Microscopy
Scanning Transmission Electron Microscopy: Z Contrast
Composition Mapping
Imaging Secondary Ion Mass Spectroscopy
IMAGE RECORDING, HANDLING AND PROCESSING
Image Recording in Microscopy
Image Processing
Statistical Parameter Estimation
VOLUME 2: Applications
Metals and Alloys
Minerals and Geological Materials
Ferroic Materials
Grain Boundaries and Structural Ceramics
Non-Periodic Structures and Amorphous Materials
Quasi-Crystalline Materials
Carbon
Polymers and Monomeric Analogs
Magnetic Materials
Small Particles
Preparation Techniques for Transmission Electron Microscopy
Catalytic Materials and Porous Materials
Nanowires and Nanotubes
Biomaterials
Complex Oxides
Energy Materials
Surfaces and Interfaces
Polymers
Semiconductors and Semiconducting Devices
Optoelectronic and Spintronics Materials
Advanced Grant.
Dirk Van Dyck is professor in physics and honorary vice-rector for research at the University of Antwerp. He graduated from the University of Antwerp in 1976 and spent his career at this University. Professor Van Dyck and has authored over 300 scientific publications in international
journals and was invited speaker at numerous conferences on electron microscopy and image processing. He was one of the co-editors of the Handbook of Microscopy. He received the Honory Franqui Chair of the University of Leuven and holds a Honorary Doctorship of the University of Lima.
Stephen J. Pennycook is a Corporate Fellow in the Materials Science and Technology Division at Oak Ridge National Laboratory and leader of the Scanning Transmission Electron Microscopy Group. He graduated from the University of Cambridge in 1975, moving to Oak Ridge
National Laboratory in 1982. Professor Pennycook has authored over 380 scientific publications in international journals and was invited speaker at over 200 conferences. He is a member of the editorial boards of four journals and a fellow of five professional societies. For his work on Z-contrast microscopy he was awarded the Materials Research Society Medal and the Thomas Young Medal of the Institute of Physics.
