Digital Logic Testing and Simulation

Your road map for meeting today's digital testing challenges

Today, digital logic devices are common in products that impact
public safety, including applications in transportation and human
implants. Accurate testing has become more critical to reliability,
safety, and the bottom line. Yet, as digital systems become more
ubiquitous and complex, the challenge of testing them has become
more difficult. As one development group designing a RISC stated,
"the work required to . . . test a chip of this size approached the
amount of effort required to design it." A valued reference for
nearly two decades, Digital Logic Testing and Simulation has been
significantly revised and updated for designers and test engineers
who must meet this challenge.

There is no single solution to the testing problem. Organized in an
easy-to-follow, sequential format, this Second Edition familiarizes
the reader with the many different strategies for testing and their
applications, and assesses the strengths and weaknesses of the
various approaches. The book reviews the building blocks of a
successful testing strategy and guides the reader on choosing the
best solution for a particular application. Digital Logic Testing
and Simulation, Second Edition covers such key topics as:

* Binary Decision Diagrams (BDDs) and cycle-based simulation

* Tester architectures/Standard Test Interface Language
(STIL)

* Practical algorithms written in a Hardware Design Language
(HDL)

* Fault tolerance

* Behavioral Automatic Test Pattern Generation (ATPG)

* The development of the Test Design Expert (TDX), the many
obstacles encountered and lessons learned in creating this novel
testing approach

Up-to-date and comprehensive, Digital Logic Testing and Simulation
is an important resource for anyone charged with pinpointing faulty
products and assuring quality, safety, and profitability.