Handbook of Nanoscopy
1. Auflage April 2012
XXXII, 1418 Seiten, Hardcover
838 Abbildungen (99 Farbabbildungen)
15 Tabellen
Handbuch/Nachschlagewerk
ISBN:
978-3-527-31706-6
Wiley-VCH, Weinheim
Kurzbeschreibung
In-depth coverage of all imaging technologies from the optical to the electron and scanning techniques. Adopting a twofold approach, this ready reference and handbook in one firstly presents the various technologies as such, before going on to cover the materials class by class.
Jetzt kaufen
Preis: 469,00 €
Preis inkl. MwSt, zzgl. Versand
Euro-Preise für Wiley-VCH- und Ernst & Sohn-Titel sind nur für Deutschland gültig. In EU-Ländern gilt die lokale Mehrwertsteuer. Portokosten werden berechnet.
- Gedruckte Ausgabe vergriffen -
Weitere Versionen
This completely revised successor to the Handbook of Microscopy supplies in-depth coverage of all imaging technologies from the optical
to the electron and scanning techniques. Adopting a twofold approach, the book firstly presents the various technologies as such, before going
on to cover the materials class by class, analyzing how the different imaging methods can be successfully applied. It covers the latest developments in techniques, such as in-situ TEM, 3D imaging in TEM and SEM, as well as a broad range of material types, including metals,
alloys, ceramics, polymers, semiconductors, minerals, quasicrystals, amorphous solids, among others. The volumes are divided between
methods and applications, making this both a reliable reference and handbook for chemists, physicists, biologists, materials scientists and
engineers, as well as graduate students and their lecturers.
VOLUME 1
PREFACE
THE PAST, THE PRESENT, AND THE FUTURE OF NANOSCOPY
PART I: Methods
TRANSMISSION ELECTRON MICROSCOPY
Introduction
The Instrument
Imaging and Diffraction Modes
Dynamical Diffraction Theory
ATOMIC RESOLUTION ELECTRON MICROSCOPY
Introduction
Principles of Linear Image Formation
Imaging in the Electron Microscope
Experimental HREM
Quantitative HREM
ULTRAHIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY AT NEGATIVE SPHERICAL ABERRATION
Introduction
The Principles of Atomic-Resolution Imaging
Inversion of the Imaging Process
Case Study: SrTiO3
Practical Examples of Application of NCSI Imaging
Z-CONTRAST IMAGING
Recent Progress
Introduction to the Instrument
Imaging in the STEM
Future Outlook
ELECTRON HOLOGRAPHY
Image-Plane Off-Axis Holography Using the Electron Biprism
Properties of the Reconstructed Wave
Holographic Investigations
Special Techniques
Summary
LORENTZ MICROSCOPY AND ELECTRON HOLOGRAPHY OF MAGNETIC MATERIALS
Introduction
Lorentz Microscopy
Off-Axis Electron Holography
Discussion and Conclusions
ELECTRON TOMOGRAPHY
History and Background
Theory of Tomography
Electron Tomography, Missing Wedge, and Imaging Modes
STEM Tomography and Applications
Hollow-Cone DF Tomography
Diffraction Contrast Tomography
Electron Holographic Tomography
Inelastic Electron Tomography
Advanced Reconstruction Techniques
Quantification and Atomic Resolution Tomography
STATISTICAL PARAMETER ESTIMATION THEORY - A TOOL FOR QUANTITATIVE ELECTRON MICROSCOPY
Introduction
Methodology
Electron Microscopy Applications
Conclusions
DYNAMIC TRANSMISSION ELECTRON MICROSCOPY
Introduction
Time-Resolved Studies Using Electrons
Building a DTEM
Applications of DTEM
Future Developments for DTEM
Conclusions
TRANSMISSION ELECTRON MICROSCOPY AS NANOLAB
TEM and Measuring the Electrical Properties
TEM with MEMS-Based Heaters
TEM with Gas Nanoreactors
TEM with Liquid Nanoreactors
TEM and Measuring Optical Properties
Sample Preparation for Nanolab Experiments
ATOMIC-RESOLUTION ENVIRONMENTAL TRANSMISSION ELECTRON MICROSCOPY
Introduction
Atomic-Resolution ETEM
Development of Atomic-Resolution ETEM
Experimental Procedures
Applications with Examples
Nanoparticles and Catalytic Materials
Oxides
In situ Atomic Scale Twinning Transformations in Metal Carbides
Dynamic Electron Energy Loss Spectroscopy
Technological Benefits of Atomic-Resolution ETEM
Other Advances
Reactions in the Liquid Phase
In situ Studies with Aberration Correction
Examples and Discussion
Applications to Biofuels
Conclusions
SPECKLES IN IMAGES AND DIFFRACTION PATTERNS
Introduction
What Is Speckle?
What Causes Speckle?
Diffuse Scattering
From Bragg Reflections to Speckle
Coherence
Fluctuation Electron Microscopy
Variance versus Mean
Speckle Statistics
Possible Future Directions for Electron Speckle Analysis
COHERENT ELECTRON DIFFRACTIVE IMAGING
Introduction
Coherent Nanoarea Electron Diffraction
The Noncrystallographic Phase Problem
Coherent Diffractive Imaging of Finite Objects
Phasing Experimental Diffraction Pattern
Conclusions
SAMPLE PREPARATION TECHNIQUES FOR TRANSMISSION ELECTRON MICROSCOPY
Introduction
Indirect Preparation Methods
Direct Preparation Methods
Summary
SCANNING PROBE MICROSCOPY - HISTORY, BACKGROUND, AND STATE OF THE ART
Introduction
Detecting Evanescent Waves by Near-Field Microscopy: Scanning Tunneling Microscopy
Interaction of Tip - Sample Electrons Detected by Scanning Near-Field Optical Microscopy and Atomic Force Microscopy
Methods for the Detection of Electric/Electronic Sample Properties
Methods for the Detection of Electromechanical and Thermoelastic Quantities
Advanced SFM/SEM Microscopy
SCANNING PROBE MICROSCOPY - FORCES AND CURRENTS IN THE NANOSCALE WORLD
Introduction
Scanning Probe Microscopy-the Science of Localized Probes
Scanning Tunneling Microscopy and Related Techniques
Force-Based SPM Measurements
Voltage Modulation SPMs
Current Measurements in SPM
Emergent SPM Methods
Manipulation of Matter by SPM
Perspectives
SCANNING BEAM METHODS
Scanning Microscopy
Conclusions
FUNDAMENTALS OF THE FOCUSED ION BEAM SYSTEM
Focused Ion Beam Principles
FIB Techniques
VOLUME 2
PREFACE
LOW-ENERGY ELECTRON MICROSCOPY
Introduction
Theoretical Foundations
Instrumentation
Areas of Application
Discussion
Concluding Remarks
SPIN-POLARIZED LOW-ENERGY ELECTRON MICROSCOPY
Introduction
Theoretical Foundations
Instrumentation
Areas of Application
Discussion
Concluding Remarks
IMAGING SECONDARY ION MASS SPECTROSCOPY
Fundamentals
SIMS Techniques
Biological SIMS
Conclusions
SOFT X-RAY IMAGING AND SPECTROMICROSCOPY
Introduction
Experimental Techniques
Data Analysis Methods
Selected Applications
Future Outlook and Summary
ATOM PROBE TOMOGRAPHY: PRINCIPLE AND APPLICATIONS
Introduction
Basic Principles
Field Ion Microscopy
Atom Probe Tomography
Conclusion
SIGNAL AND NOISE MAXIMUM LIKELIHOOD ESTIMATION IN MRI
Probability Density Functions in MRI
Signal Amplitude Estimation
Noise Variance Estimation
Conclusions
3-D SURFACE RECONSTRUCTION FROM STEREO SCANNING ELECTRON MICROSCOPY IMAGES
Introduction
Matching Stereo Images
Conclusions
PART II: Applications
NANOPARTICLES
Introduction
Imaging Nanoparticles
Electron Tomography of Nanoparticles
Nanoanalytical Characterization of Nanoparticles
In situ TEM Characterization of Nanoparticles
NANOWIRES AND NANOTUBES
Introduction
Structures of Nanowires and Nanotubes
Defects in Nanowires
In situ Observation of the Growth Process of Nanowires and Nanotubes
In situ Electric Transport Property of Carbon Nanotubes
In situ TEM Investigation of Electrochemical Properties of Nanowires
Summary
CARBON NANOFORMS
Imaging Carbon Nanoforms Using Conventional Electron Microscopy
Analysis of Carbon Nanoforms Using Aberration-Corrected Electron Microscopes
Ultrafast Electron Microscopy
Scanning Tunneling Microscopy (STM)
Scanning Photocurrent Microscopy (SPCM)
X-Ray Electrostatic Force Microscopy (X-EFM)
Atomic Force Microscopy
Scanning Near-Field Optical Microscope
Tip-Enhanced Raman and Confocal Microscopy
Tip-Enhanced Photoluminescence Microscopy
Fluorescence Quenching Microscopy
Fluorescence Microscopy
Single-Shot Extreme Ultraviolet Laser Imaging
Nanoscale Soft X-Ray Imaging
Scanning Photoelectron Microscopy
METALS AND ALLOYS
Formation of Nanoscale Deformation Twins by Shockley Partial Dislocation Passage
Minimal Strain at Austenite-Martensite Interface in Ti-Ni-Pd
Atomic Structure of Ni4Ti3 Precipitates in Ni-Ti
Ni-Ti Matrix Deformation and Concentration Gradients in the Vicinity of Ni4Ti3 Precipitates
Elastic Constant Measurements of Ni4Ti3 Precipitates
New APB-Like Defect in Ti-Pd Martensite Determined by HRSTEM
Strain Effects in Metallic Nanobeams
Adiabatic Shear Bands in Ti6Al4V
Electron Tomography
The Ultimate Resolution
IN SITU TRANSMISSION ELECTRON MICROSCOPY ON METALS
Introduction
In situ TEM Experiments
Grain Boundary Dislocation Dynamics Metals
In situ TEM Tensile Experiments
In situ TEM Compression Experiments
Conclusions
SEMICONDUCTORS AND SEMICONDUCTING DEVICES
Introduction
Nanoscopic Applications on Silicon-Based Semiconductor Devices
Conclusions
COMPLEX OXIDE MATERIALS
Introduction
Aberration-Corrected Spectrum Imaging in the STEM
Imaging of Oxygen Lattice Distortions in Perovskites and Oxide Thin Films and Interfaces
Atomic-Resolution Effects in the Fine Structure - Further Insights into Oxide Interface Properties
Applications of Ionic Conductors: Studies of Colossal Ionic Conductivity in Oxide Superlattices
Applications of Cobaltites: Spin-State Mapping with Atomic Resolution
Summary
APPLICATION OF TRANSMISSION ELECTRON MICROSCOPY IN THE RESEARCH OF INORGANIC PHOTOVOLTAIC MATERIALS
Introduction
Experimental
Atomic Structure and Electronic Properties of c-Si/a-Si:H Heterointerfaces
Interfaces and Defects in CdTe Solar Cells
Influences of Oxygen on Interdiffusion at CdS/CdTe Heterojunctions
Microstructure Evolution of Cu(In,Ga)Se2 Films fromCu Rich to In Rich
Microstructure of Surface Layers in Cu(In,Ga)Se2 Thin Films
Chemical Fluctuation-Induced Nanodomains in Cu(In,Ga)Se2 Films
Conclusions and Future Directions
POLYMERS
Foreword
A Brief Introduction on Printable Solar Cells
Morphology Requirements of Photoactive Layers in PSCs
Our Characterization Toolbox
How It All Started: First Morphology Studies
Contrast Creation in Purely Carbon-Based BHJ Photoactive Layers
Nanoscale Volume Information: Electron Tomography of PSCs
One Example of Electron Tomographic Investigation: P3HT/PCBM
Quantification of Volume Data
Outlook and Concluding Remarks
FERROIC AND MULTIFERROIC MATERIALS
Multiferroicity
Ferroic Domain Patterns and Their Microscopical Observation
The Internal Structure of Domain Walls
Domain Structures Related to Amorphization
Dynamical Properties of Domain Boundaries
Conclusion
THREE-DIMENSIONAL IMAGING OF BIOMATERIALS WITH ELECTRON TOMOGRAPHY
Introduction
Biological Tomographic Techniques
Examples of Electron Tomography Biomaterials
Outlook
SMALL ORGANIC MOLECULES AND HIGHER HOMOLOGS
Introduction
Optical Microscopy
Scanning Electron Microscopy - SEM
Atomic Force and Scanning Tunneling Microscopy (AFM and STM)
Transmission Electron Microscopy (TEM)
Summary
PREFACE
THE PAST, THE PRESENT, AND THE FUTURE OF NANOSCOPY
PART I: Methods
TRANSMISSION ELECTRON MICROSCOPY
Introduction
The Instrument
Imaging and Diffraction Modes
Dynamical Diffraction Theory
ATOMIC RESOLUTION ELECTRON MICROSCOPY
Introduction
Principles of Linear Image Formation
Imaging in the Electron Microscope
Experimental HREM
Quantitative HREM
ULTRAHIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY AT NEGATIVE SPHERICAL ABERRATION
Introduction
The Principles of Atomic-Resolution Imaging
Inversion of the Imaging Process
Case Study: SrTiO3
Practical Examples of Application of NCSI Imaging
Z-CONTRAST IMAGING
Recent Progress
Introduction to the Instrument
Imaging in the STEM
Future Outlook
ELECTRON HOLOGRAPHY
Image-Plane Off-Axis Holography Using the Electron Biprism
Properties of the Reconstructed Wave
Holographic Investigations
Special Techniques
Summary
LORENTZ MICROSCOPY AND ELECTRON HOLOGRAPHY OF MAGNETIC MATERIALS
Introduction
Lorentz Microscopy
Off-Axis Electron Holography
Discussion and Conclusions
ELECTRON TOMOGRAPHY
History and Background
Theory of Tomography
Electron Tomography, Missing Wedge, and Imaging Modes
STEM Tomography and Applications
Hollow-Cone DF Tomography
Diffraction Contrast Tomography
Electron Holographic Tomography
Inelastic Electron Tomography
Advanced Reconstruction Techniques
Quantification and Atomic Resolution Tomography
STATISTICAL PARAMETER ESTIMATION THEORY - A TOOL FOR QUANTITATIVE ELECTRON MICROSCOPY
Introduction
Methodology
Electron Microscopy Applications
Conclusions
DYNAMIC TRANSMISSION ELECTRON MICROSCOPY
Introduction
Time-Resolved Studies Using Electrons
Building a DTEM
Applications of DTEM
Future Developments for DTEM
Conclusions
TRANSMISSION ELECTRON MICROSCOPY AS NANOLAB
TEM and Measuring the Electrical Properties
TEM with MEMS-Based Heaters
TEM with Gas Nanoreactors
TEM with Liquid Nanoreactors
TEM and Measuring Optical Properties
Sample Preparation for Nanolab Experiments
ATOMIC-RESOLUTION ENVIRONMENTAL TRANSMISSION ELECTRON MICROSCOPY
Introduction
Atomic-Resolution ETEM
Development of Atomic-Resolution ETEM
Experimental Procedures
Applications with Examples
Nanoparticles and Catalytic Materials
Oxides
In situ Atomic Scale Twinning Transformations in Metal Carbides
Dynamic Electron Energy Loss Spectroscopy
Technological Benefits of Atomic-Resolution ETEM
Other Advances
Reactions in the Liquid Phase
In situ Studies with Aberration Correction
Examples and Discussion
Applications to Biofuels
Conclusions
SPECKLES IN IMAGES AND DIFFRACTION PATTERNS
Introduction
What Is Speckle?
What Causes Speckle?
Diffuse Scattering
From Bragg Reflections to Speckle
Coherence
Fluctuation Electron Microscopy
Variance versus Mean
Speckle Statistics
Possible Future Directions for Electron Speckle Analysis
COHERENT ELECTRON DIFFRACTIVE IMAGING
Introduction
Coherent Nanoarea Electron Diffraction
The Noncrystallographic Phase Problem
Coherent Diffractive Imaging of Finite Objects
Phasing Experimental Diffraction Pattern
Conclusions
SAMPLE PREPARATION TECHNIQUES FOR TRANSMISSION ELECTRON MICROSCOPY
Introduction
Indirect Preparation Methods
Direct Preparation Methods
Summary
SCANNING PROBE MICROSCOPY - HISTORY, BACKGROUND, AND STATE OF THE ART
Introduction
Detecting Evanescent Waves by Near-Field Microscopy: Scanning Tunneling Microscopy
Interaction of Tip - Sample Electrons Detected by Scanning Near-Field Optical Microscopy and Atomic Force Microscopy
Methods for the Detection of Electric/Electronic Sample Properties
Methods for the Detection of Electromechanical and Thermoelastic Quantities
Advanced SFM/SEM Microscopy
SCANNING PROBE MICROSCOPY - FORCES AND CURRENTS IN THE NANOSCALE WORLD
Introduction
Scanning Probe Microscopy-the Science of Localized Probes
Scanning Tunneling Microscopy and Related Techniques
Force-Based SPM Measurements
Voltage Modulation SPMs
Current Measurements in SPM
Emergent SPM Methods
Manipulation of Matter by SPM
Perspectives
SCANNING BEAM METHODS
Scanning Microscopy
Conclusions
FUNDAMENTALS OF THE FOCUSED ION BEAM SYSTEM
Focused Ion Beam Principles
FIB Techniques
VOLUME 2
PREFACE
LOW-ENERGY ELECTRON MICROSCOPY
Introduction
Theoretical Foundations
Instrumentation
Areas of Application
Discussion
Concluding Remarks
SPIN-POLARIZED LOW-ENERGY ELECTRON MICROSCOPY
Introduction
Theoretical Foundations
Instrumentation
Areas of Application
Discussion
Concluding Remarks
IMAGING SECONDARY ION MASS SPECTROSCOPY
Fundamentals
SIMS Techniques
Biological SIMS
Conclusions
SOFT X-RAY IMAGING AND SPECTROMICROSCOPY
Introduction
Experimental Techniques
Data Analysis Methods
Selected Applications
Future Outlook and Summary
ATOM PROBE TOMOGRAPHY: PRINCIPLE AND APPLICATIONS
Introduction
Basic Principles
Field Ion Microscopy
Atom Probe Tomography
Conclusion
SIGNAL AND NOISE MAXIMUM LIKELIHOOD ESTIMATION IN MRI
Probability Density Functions in MRI
Signal Amplitude Estimation
Noise Variance Estimation
Conclusions
3-D SURFACE RECONSTRUCTION FROM STEREO SCANNING ELECTRON MICROSCOPY IMAGES
Introduction
Matching Stereo Images
Conclusions
PART II: Applications
NANOPARTICLES
Introduction
Imaging Nanoparticles
Electron Tomography of Nanoparticles
Nanoanalytical Characterization of Nanoparticles
In situ TEM Characterization of Nanoparticles
NANOWIRES AND NANOTUBES
Introduction
Structures of Nanowires and Nanotubes
Defects in Nanowires
In situ Observation of the Growth Process of Nanowires and Nanotubes
In situ Electric Transport Property of Carbon Nanotubes
In situ TEM Investigation of Electrochemical Properties of Nanowires
Summary
CARBON NANOFORMS
Imaging Carbon Nanoforms Using Conventional Electron Microscopy
Analysis of Carbon Nanoforms Using Aberration-Corrected Electron Microscopes
Ultrafast Electron Microscopy
Scanning Tunneling Microscopy (STM)
Scanning Photocurrent Microscopy (SPCM)
X-Ray Electrostatic Force Microscopy (X-EFM)
Atomic Force Microscopy
Scanning Near-Field Optical Microscope
Tip-Enhanced Raman and Confocal Microscopy
Tip-Enhanced Photoluminescence Microscopy
Fluorescence Quenching Microscopy
Fluorescence Microscopy
Single-Shot Extreme Ultraviolet Laser Imaging
Nanoscale Soft X-Ray Imaging
Scanning Photoelectron Microscopy
METALS AND ALLOYS
Formation of Nanoscale Deformation Twins by Shockley Partial Dislocation Passage
Minimal Strain at Austenite-Martensite Interface in Ti-Ni-Pd
Atomic Structure of Ni4Ti3 Precipitates in Ni-Ti
Ni-Ti Matrix Deformation and Concentration Gradients in the Vicinity of Ni4Ti3 Precipitates
Elastic Constant Measurements of Ni4Ti3 Precipitates
New APB-Like Defect in Ti-Pd Martensite Determined by HRSTEM
Strain Effects in Metallic Nanobeams
Adiabatic Shear Bands in Ti6Al4V
Electron Tomography
The Ultimate Resolution
IN SITU TRANSMISSION ELECTRON MICROSCOPY ON METALS
Introduction
In situ TEM Experiments
Grain Boundary Dislocation Dynamics Metals
In situ TEM Tensile Experiments
In situ TEM Compression Experiments
Conclusions
SEMICONDUCTORS AND SEMICONDUCTING DEVICES
Introduction
Nanoscopic Applications on Silicon-Based Semiconductor Devices
Conclusions
COMPLEX OXIDE MATERIALS
Introduction
Aberration-Corrected Spectrum Imaging in the STEM
Imaging of Oxygen Lattice Distortions in Perovskites and Oxide Thin Films and Interfaces
Atomic-Resolution Effects in the Fine Structure - Further Insights into Oxide Interface Properties
Applications of Ionic Conductors: Studies of Colossal Ionic Conductivity in Oxide Superlattices
Applications of Cobaltites: Spin-State Mapping with Atomic Resolution
Summary
APPLICATION OF TRANSMISSION ELECTRON MICROSCOPY IN THE RESEARCH OF INORGANIC PHOTOVOLTAIC MATERIALS
Introduction
Experimental
Atomic Structure and Electronic Properties of c-Si/a-Si:H Heterointerfaces
Interfaces and Defects in CdTe Solar Cells
Influences of Oxygen on Interdiffusion at CdS/CdTe Heterojunctions
Microstructure Evolution of Cu(In,Ga)Se2 Films fromCu Rich to In Rich
Microstructure of Surface Layers in Cu(In,Ga)Se2 Thin Films
Chemical Fluctuation-Induced Nanodomains in Cu(In,Ga)Se2 Films
Conclusions and Future Directions
POLYMERS
Foreword
A Brief Introduction on Printable Solar Cells
Morphology Requirements of Photoactive Layers in PSCs
Our Characterization Toolbox
How It All Started: First Morphology Studies
Contrast Creation in Purely Carbon-Based BHJ Photoactive Layers
Nanoscale Volume Information: Electron Tomography of PSCs
One Example of Electron Tomographic Investigation: P3HT/PCBM
Quantification of Volume Data
Outlook and Concluding Remarks
FERROIC AND MULTIFERROIC MATERIALS
Multiferroicity
Ferroic Domain Patterns and Their Microscopical Observation
The Internal Structure of Domain Walls
Domain Structures Related to Amorphization
Dynamical Properties of Domain Boundaries
Conclusion
THREE-DIMENSIONAL IMAGING OF BIOMATERIALS WITH ELECTRON TOMOGRAPHY
Introduction
Biological Tomographic Techniques
Examples of Electron Tomography Biomaterials
Outlook
SMALL ORGANIC MOLECULES AND HIGHER HOMOLOGS
Introduction
Optical Microscopy
Scanning Electron Microscopy - SEM
Atomic Force and Scanning Tunneling Microscopy (AFM and STM)
Transmission Electron Microscopy (TEM)
Summary
Gustaaf Van Tendeloo studied physics and graduated from the University of Antwerp in 1974. He is now a professor at the University of Antwerp (UA) and part time professor at the University of Brussels (VUB). His research focuses on the applications of electron microscopy to different aspects of materials science. He is the author of 700 publications with over 16 000 citations to his work. Professor Van Tendeloo is the head of the electron microscopy group EMAT and director of the "Nano Center of Excellence" of the University. In 2009, he received an ERC
Advanced Grant.
Dirk Van Dyck is professor in physics and honorary vice-rector for research at the University of Antwerp. He graduated from the University of Antwerp in 1976 and spent his career at this University. Professor Van Dyck and has authored over 300 scientific publications in international
journals and was invited speaker at numerous conferences on electron microscopy and image processing. He was one of the co-editors of the Handbook of Microscopy. He received the Honory Franqui Chair of the University of Leuven and holds a Honorary Doctorship of the University of Lima.
Stephen J. Pennycook is a Corporate Fellow in the Materials Science and Technology Division at Oak Ridge National Laboratory and leader of the Scanning Transmission Electron Microscopy Group. He graduated from the University of Cambridge in 1975, moving to Oak Ridge
National Laboratory in 1982. Professor Pennycook has authored over 380 scientific publications in international journals and was invited speaker at over 200 conferences. He is a member of the editorial boards of four journals and a fellow of five professional societies. For his work on Z-contrast microscopy he was awarded the Materials Research Society Medal and the Thomas Young Medal of the Institute of Physics.
Advanced Grant.
Dirk Van Dyck is professor in physics and honorary vice-rector for research at the University of Antwerp. He graduated from the University of Antwerp in 1976 and spent his career at this University. Professor Van Dyck and has authored over 300 scientific publications in international
journals and was invited speaker at numerous conferences on electron microscopy and image processing. He was one of the co-editors of the Handbook of Microscopy. He received the Honory Franqui Chair of the University of Leuven and holds a Honorary Doctorship of the University of Lima.
Stephen J. Pennycook is a Corporate Fellow in the Materials Science and Technology Division at Oak Ridge National Laboratory and leader of the Scanning Transmission Electron Microscopy Group. He graduated from the University of Cambridge in 1975, moving to Oak Ridge
National Laboratory in 1982. Professor Pennycook has authored over 380 scientific publications in international journals and was invited speaker at over 200 conferences. He is a member of the editorial boards of four journals and a fellow of five professional societies. For his work on Z-contrast microscopy he was awarded the Materials Research Society Medal and the Thomas Young Medal of the Institute of Physics.
