Swift Ion Beam Analysis in Nanosciences
1. Auflage August 2017
288 Seiten, Hardcover
Wiley & Sons Ltd
This book examines the different ion beam analysis techniques, which find relevant applications in the field of nanoscience. Ion beam analysis techniques are well established and have been widely used in materials sciences since the 1960s. Over the past two decades, the emergence of nanomaterials in science and technology has pushed many analytical techniques to their limits. This is also the case for techniques using an ion beam to probe nanoscale objects. The book discusses the various possibilities of the ion beam analysis for nanosciences and also seeks to position these techniques over other analytical tools.
Fundamentals of ion-solid interactions with a focus on the nanoscale
Channelling and blocking
1D layers: Limits to depth resolution
2D and 3D objects: Aspects of lateral resolution
Porous materials / nanomaterials
Instruments
Grazing incidence RBS
RBS-channelling/blocking
High resolution RBS (magnetic or electrostatic filters)
MEIS
Resonant NRA
The place of nanoIBA in the characterisation forest
Applications
Example of resonances, light element profiling
3D example / quantum dots and nanowires / top down devices
Channelling / defect profiling
Blocking / strain profiling
3D MEIS / Real space structural analysis
Conclusion